Publication List of Semiconductor Device and Technology

  • Mehedi Hasan, Md. Jobayer Hossein, Mainul Hossain, Hasan U. Zaman, Sharnali Islam, "Design of a Scalable Low-Power 1-bit Hybrid Full Adder for Fast Computation," IEEE Transactions on Circuits and Systems II: Express Briefs, PP(99):1-1, DOI: 10.1109/TCSII.2019.2940558, September, 2019

  • Tanzilur Rahman, Takanori Ichiki, "Fabrication and Characterization of a Stabilized Thin Film Ag/AgCl Reference Electrode Modified with Self-Assembled Monolayer of Alkane Thiol Chains for Rapid Biosensing Applications”,," Sensors , 2017

  • M. A. Muzahid, M. F. R. Ansari, K. M. A. Salam and H. U. Zaman, "A High Voltage Gain DC-DC Boost Converter for PV Cells," Global Science and Technology Journal, vol. 3, no. 1, pp. 64 – 76, 2015

  • Nikita Mahjabeen, K. M. A. Salam, "Comparative Study and Design Optimization of Supercapacitors for High Powered LED Flashlight Camera Phones," International Journal of Scientific & Engineering Research (IJSER), Vol.6. No.7, (2015), pp. 471-477., 2015

  • Safayat-Al Imam, Nasheen Kalam, Sharmin Abdullah, "Comparative Analysis of Control Coefficients on the Performance of CNTFET under Different Parameters," IJNS (World Scientific), 2015

  • Tanzilur Rahman, Takekazu Masui, Takanori Ichiki, "“A single-crystal galium oxide based biomolecular modified diode for nucleic acid sensing”," Japanese Journal of Applied Physics, 2015,54, 04DL08, 2015

  • Safayat Al Imam, Nasheen Kalam, Sharmin Abdullah, "Temperature Dependence of Carbon Nanotube Field Effect Transistor under Non-ballistic conduction considering Different Dielectric Materials," Scientific & Academic Publication (SAP), 2014

  • G. Wirth, D. Vasileska, N. Ashraf, L. Brusamarello, R. D. Guistina, P. Srinivasan, "Compact Modeling and Simulation of Random Telegraph Noise Under Non-Stationary Conditions In the Presence of Random Dopants," Microelectronics Reliability, 2012

  • N. Ashraf, D. Vasileska, G. Wirth, P. Srinivasan, "Accurate Model for the Threshold Voltage Fluctuations Estimation in 45 nm Channel Length MOSFET Devices in the Presence of Random Traps and Random Dopants," IEEE Electron Device Letters, 2011

  • N. Ashraf, D. Vasileska, "Static Analysis of Random Telegraph Noise in a 45 nm Channel Length Conventional MOSFET Device," IEEE Transactions on Nanotechnology, 2011

  • V. V. A. Camargo, N. Ashraf, L. Brusamarello, D. Vasileska, G. Wirth, "Impact of RDF and RTS On the Peformance of SRAM Cells," Journal of Computational Electronics, 2010

  • N. Ashraf, D. Vasileska, "1/f Noise: Threshold Voltage and On-Current Fluctuations in 45 nm Device Technology Due To Charged Random Traps," Journal of Computational Electronics, 2010

  • R. Agrawal, Q. Hasan, N. Ashraf, J. Kapat, K. B. Sundaram, J. Vaidya, "Design and Fabrication of a Meso-Scale Variable Capacitance Motor For Miniature Heat Pumps," Journal of Micromechanics and Microengineering, 2003

  • B. F. Romanowicz, H. U. Zaman, S. F. Bart, V. L. Rabinovich, I. Tchertkov, S. Zhang, M. G. da Silva, M. Deshpande, K. Greiner, J. R. Gilbert, and S. Cunningham, "A Methodology and Associated CAD Tools for Support of Concurrent Design of MEMS," CMES, vol. 1, no. 1, pp. 45-63, 2000

  • H. U. Zaman, E. T. Carlen, and C. H. Mastrangelo, "Automatic Generation of Thin Film Process Flows — Part I: Basic Algorithms," IEEE Transactions on Semiconductor Manufacturing, vol. 12, no. 1, pp. 116-128, 1999

  • H. U. Zaman, E. T. Carlen, and C. H. Mastrangelo, "Automatic Generation of Thin Film Process Flows — Part II: Recipe Generation, Flow Evaluation, and System Framework," IEEE Transactions on Semiconductor Manufacturing, vol. 12, no. 1, pp. 129-138, 1999

  • H. U. Zaman, S. F. Bart, J. R. Gilbert, N. R. Swart, and M. Mariappan, "An Environment for Design and Modeling of Electro-Mechanical Micro-Systems," Journal of Modeling and Simulation of Microsystems, vol. 1, no. 1, pp. 65-76, 1999

  • H. U. Zaman and C. H. Mastrangelo, "Process compilation of thin film microdevices," IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, vol. 15, no. 7, pp. 745-764, 1996