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Reliability Studies in 45 nm Technology Node Threshold Voltage Fluctuations due to Random Dopants and Random Telegraph Noise
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3D Ensemble Monte Carlo Device Simulations of Random Trap Induced Degradation in Drain Current and in Threshold Voltage in the Presence of Random Dopant Distributions for 45 nm Gate Length n-MOSFET
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Reliability Studies in 45 nm Technology Node Threshold Voltage Fluctuations due to Random Dopants and Random Telegraph Noise
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Modeling Fluctuations in the Threshold Voltage and ON-current due to Random Telegraph Noise
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Comparative Study of Microactuators as Elements of Current MEMS based Devices for Diversified Technological Applications
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Concept and Design of a Micromachined Miniature Variable Capacitance Motor (VCM) in Lead Zirconate Titanate (PZT) Substrate
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Energy Understanding Device (EUD): An Innovative Energy Metering and Monitoring Solution: Perspective Bangladesh
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Direct wavefront sensing in adaptive optical microscopy using backscattered light
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